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Cantilever Spring Pins

c_smCantilever Spring Pin contacts can achieve high density in a linear array. They also provide "scrub" for flat contact pads to break through oxidation layer. Below is a table of performance data. This design was developed by SEI for generic use (Ni-Mn). Specific designs are possible to control scrub, spring force, and contact (mounting) geometry.

 
 

Pitch:

80µm linear

 

Force:

5g (@100µm travel)

 

Max. Stroke:

150µm

 

Scrub Length:

10-15µm

 

Temp. Tested:

125°C*

 

Fatigue Life:

300k

 

Current Tested:

0.5-1A

*Ni-W version Temp. Tested to 200°C

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